AlN sensor based on surface acoustic wave with signal amplification by AlN/GaN HEMT

被引:0
|
作者
Tsarik, Konstantin A. [1 ]
Lavrentiev, Kirill K. [1 ]
Nevolin, Vladimir K. [1 ]
Petukhov, Vladimir A. [1 ]
机构
[1] Natl Res Univ Elect Technol, Moscow, Russia
关键词
aluminum nitride; gallium nitride; molecular beam epitaxy; piezoelectric; surface acoustic wave; high electron mobility transistor; plasma etching;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This article presents from the sensor based on a surface acoustic wave(SAW) GaN transistors for processing the output signal and placed at the sensor chip. The results of development of sensors based on surface acoustic waves in epitaxial films A1N are demonstrated. Operating frequency of structures for SAW was 930 MHz. A1NGaN high electron mobility transistor (HEMT) with a nanoscale T-shaped gate and very low barrier thickness is described. The efficiency and selectivity of sensory structures in liquid media with different compositions were demonstrated. The observed sensitivity of the SAW phase change is 6 while varying the concentration of sucrose in the solution at 5%.
引用
收藏
页码:718 / 721
页数:4
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