Electrical transport and persistent photoconductivity in quantum dot layers in InAs/GaAs structures

被引:4
|
作者
Kul'bachinskii, VA [1 ]
Lunin, RA
Kytin, VG
Golikov, AV
Demin, AV
Rogozin, VA
Zvonkov, BN
Nekorkin, SM
Filatov, DO
机构
[1] Moscow MV Lomonosov State Univ, Moscow 119899, Russia
[2] Nizhni Novgorod State Univ, Physicotech Res Inst, Nizhnii Novgorod 603600, Russia
基金
俄罗斯基础研究基金会;
关键词
D O I
10.1134/1.1420451
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The conductivity of quantum dot layers is studied in InAs/GaAs structures in the temperature range from 300 to 0.05 K in the dark and using two types of illumination in magnetic fields up to 6 T. Depending on the initial concentration of current carriers, the conductivity of the structures varied from metallic (the Shubnikov-de Haas effect was observed) to hopping conductivity. At low temperatures, the temperature dependence of the resistance changed from the Mott dependence to the dependence described by the Shklovskii-Efros law for hopping conductivity in the presence of the Coulomb gap in the density of states. The conductivity of samples was studied upon their illumination at lambda = 791 nm and lambda > 1120 nm. All the samples exhibited a positive persistent photoconductivity at T < 250 K. The structures were also studied using photoluminescence and an atomic force microscope. (C) 2001 MAIK "Nauka/Interperiodica".
引用
收藏
页码:815 / 823
页数:9
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