共 50 条
- [1] Characterization of underfill materials for functional solder bumped flip chips on board applications [J]. IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 1999, 22 (01): : 111 - 119
- [2] How to select underfill materials for solder bumped flip chips on low cost substrates? [J]. 1998 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, 1998, 3582 : 693 - 700
- [3] Effects of underfill material properties on the reliability of solder bumped flip chip on board with imperfect underfill encapsulants [J]. IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2000, 23 (02): : 323 - 333
- [4] Effects of underfill material properties on the reliability of solder bumped flip chip on board with imperfect underfill encapsulants [J]. 49TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 1999 PROCEEDINGS, 1999, : 571 - 582
- [5] Effects of underfill material properties on the reliability of solder bumped flip chip on board with imperfect underfill encapsulants [J]. Proceedings - Electronic Components and Technology Conference, 1999, : 571 - 582
- [6] Effects of underfill delamination and chip size on the reliability of solder bumped flip chip on board [J]. 1999 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS, 1999, 3906 : 592 - 598
- [7] Development of no-flow underfill materials for lead-free solder bumped flip-chip applications [J]. IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2001, 24 (01): : 59 - 66
- [8] Development of no-flow underfill materials for lead-free solder bumped flip-chip applications [J]. INTERNATIONAL SYMPOSIUM ON ADVANCED PACKAGING MATERIALS: PROCESSES, PROPERTIES AND INTERFACES, PROCEEDINGS, 2000, : 278 - 284
- [9] Fluxless no-clean assembly of solder bumped flip chips [J]. 46TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 1996 PROCEEDINGS, 1996, : 552 - 558
- [10] Fluxless no-clean assembly of solder bumped flip chips [J]. 1996, IEEE, Piscataway, NJ, United States