Imaging of a suspended helium film with 2-D electrons by interferometry

被引:5
|
作者
Valkering, AMC
Klier, J
Teske, E
van der Heijden, RW
Leiderer, P
机构
[1] Eindhoven Univ Technol, Dept Phys, NL-5600 MB Eindhoven, Netherlands
[2] Univ Konstanz, Fak Phys, D-78434 Constance, Germany
关键词
D O I
10.1023/A:1022537308297
中图分类号
O59 [应用物理学];
学科分类号
摘要
A helium film suspended between elevations on a substrate forms an excellent surface for a two-dimensional electron gas. With the structure on the substrate a quasi one-dimensional electron system can be created. Experiments probing the electrical transport properties of this system have raised questions about the suspended helium film itself. We report measurements of the suspended film using interferometry. The profile is mapped out as a function of the bull helium level beneath the substrate. By measuring the electron signal simultaneously the relation between the signal and the film profile can be obtained.
引用
收藏
页码:1115 / 1120
页数:6
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