Mapping of Surface Potentials by Electrons on a Helium Film

被引:0
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作者
E. Teske
P. Leiderer
P. Wyder
V. Shikin
机构
[1] Max-Planck-Institut für Festkörperforschung/Centre National de la Recherche Scientifique,Grenoble High Magnetic Field Laboratory
[2] Institute of Solid State Physics,undefined
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关键词
Helium; Solid State; Layer Thickness; Test Sample; Sample Surface;
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摘要
A novel way to investigate perturbations of the electrostatic potential across a sample surface is presented, aiming at application in 2D contact phenomena. The idea is to deposit surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid state sample. The density of the SSE adjusts to screen perturbations of the electrostatic potential across the sample. As a result, the helium layer thickness varies due to the variation of the electrostatic pressure, thus providing a map. This map may be read interferometrically by a technique already employed for the investigation of multi-electron dimples on helium. We realized this mapping for a structured metal electrode as a test sample to investigate the resolution of the method.
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页码:249 / 254
页数:5
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