EFSM-based testing strategy for APIs test of embedded OS

被引：0
|
作者：
Hao, SX [1 ]
Zhong, XC [1 ]
Wang, Y [1 ]
机构：
[1] Hopen Software Engn Co Ltd, Beijing 100080, Peoples R China
来源：
EMBEDDED SOFTWARE AND SYSTEMS | 2005年 / 3605卷
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, we present a two-phase approach to generate test data for the EFSM model of an embedded operating system. We first build the EFSM model of the system. The model can then be used to automatically generate test data for testing of APIs. We also point out certain issues that need further study.
引用
收藏
页码：522 / 527
页数：6
相关论文
共 50 条
  • [31] TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS
    Chae, Hochang
    Jin, Xiulin
    Lee, Seonghun
    Cho, Jeonghun
    [J]. ADVANCES IN SOFTWARE ENGINEERING, PROCEEDINGS, 2009, 59 : 204 - +
  • [32] Evaluation of test coverage for embedded system testing
    Zhu, JS
    Vuong, ST
    Chanson, ST
    [J]. TESTING OF COMMUNICATING SYSTEMS, 1998, : 111 - 126
  • [33] Embedded Testing in an In-Circuit Test Environment
    Malian, John
    Eklow, Bill
    [J]. 2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2008, : 995 - 1000
  • [34] Neural networks based test cases selection strategy for GUI testing
    Ye, Mao
    Feng, Boqin
    Lin, Yao
    Zhu, Li
    [J]. WCICA 2006: SIXTH WORLD CONGRESS ON INTELLIGENT CONTROL AND AUTOMATION, VOLS 1-12, CONFERENCE PROCEEDINGS, 2006, : 5773 - +
  • [35] Test Scenarios Construction Based on Combinatorial Testing Strategy for Automated Vehicles
    Shu, Hong
    Lv, Haoran
    Liu, Kang
    Yuan, Kang
    Tang, Xiaolin
    [J]. IEEE ACCESS, 2021, 9 : 115019 - 115029
  • [36] A test generation strategy for pairwise testing
    Tai, KC
    Lei, Y
    [J]. IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2002, 28 (01) : 109 - 111
  • [37] An Intelligent Testing System Embedded with an Ant Colony Optimization Based Test Composition Method
    Hu, Xiao-Min
    Zhang, Jun
    [J]. 2009 IEEE CONGRESS ON EVOLUTIONARY COMPUTATION, VOLS 1-5, 2009, : 1414 - 1421
  • [38] Model-based automatic test case generation for automotive embedded software testing
    Shin, Ki-Wook
    Lim, Dong-Jin
    [J]. INTERNATIONAL JOURNAL OF AUTOMOTIVE TECHNOLOGY, 2018, 19 (01) : 107 - 119
  • [39] Model-based automatic test case generation for automotive embedded software testing
    Ki-Wook Shin
    Dong-Jin Lim
    [J]. International Journal of Automotive Technology, 2018, 19 : 107 - 119
  • [40] Reformatting test patterns for testing embedded core based system using Test Access Mechanism (TAM) switch
    Basu, S
    Mukhopadhay, D
    Roychoudhury, D
    Sengupta, I
    Bhawmik, S
    [J]. ASP-DAC/VLSI DESIGN 2002: 7TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE AND 15TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS, 2002, : 598 - 603
12345