A test generation strategy for pairwise testing

被引：1
|
作者：
Tai, KC [1 ]
Lei, Y [1 ]
机构：
[1] N Carolina State Univ, Dept Comp Sci, Raleigh, NC 27695 USA
来源：
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING | 2002年 / 28卷 / 01期
关键词：
software testing; pairwise testing; test generation;
D O I：
暂无
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
Pairwise testing is a specification-based testing criterion, which requires that for each pair of input parameters of a system, every combination of valid values of these two parameters be covered by at least one test case. In this paper, we propose a new test generation strategy for pairwise testing.
引用
收藏
页码：109 / 111
页数：3
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