Measurements of the deflection angle at the electron biprism indicate that the biprism fibre is charged positively by the imaging electron beam. The charging depends on the accelerating voltage and on the biprism bias. Four basic ray diagrams with the biprism above or below the imaging lens and biased positively or negatively are discussed and applied to low-magnification arrangements. The dependences of the interference pattern and the spacing of its fringes on the voltage on the biprism fibre and the geometrical parameters given by the lens-current settings are evaluated.
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Univ Grenoble Alpes, F-38000 Grenoble, France
CNRS, Inst Neel, BP 166,25 Rue Martyrs, F-38042 Grenoble, FranceUniv Grenoble Alpes, F-38000 Grenoble, France
den Hertog, Martien
Donatini, Fabrice
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Univ Grenoble Alpes, F-38000 Grenoble, France
CNRS, Inst Neel, BP 166,25 Rue Martyrs, F-38042 Grenoble, FranceUniv Grenoble Alpes, F-38000 Grenoble, France
Donatini, Fabrice
McLeod, Robert
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Univ Grenoble Alpes, F-38000 Grenoble, France
Fdn Nanosci, Grenoble 9, France
CEA, INAC, 17 Ave Martyrs, F-38054 Grenoble, FranceUniv Grenoble Alpes, F-38000 Grenoble, France
McLeod, Robert
Monroy, Eva
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Univ Grenoble Alpes, F-38000 Grenoble, France
CEA, INAC, 17 Ave Martyrs, F-38054 Grenoble, FranceUniv Grenoble Alpes, F-38000 Grenoble, France
Monroy, Eva
Sartel, Corinne
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Univ Paris Saclay, Univ Versailles St Quentin, CNRS, Grp Etud Matiere Condensee GEMAC, F-78035 Versailles, FranceUniv Grenoble Alpes, F-38000 Grenoble, France
Sartel, Corinne
Sallet, Vincent
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Univ Paris Saclay, Univ Versailles St Quentin, CNRS, Grp Etud Matiere Condensee GEMAC, F-78035 Versailles, FranceUniv Grenoble Alpes, F-38000 Grenoble, France
Sallet, Vincent
Pernot, Julien
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Univ Grenoble Alpes, F-38000 Grenoble, France
CNRS, Inst Neel, BP 166,25 Rue Martyrs, F-38042 Grenoble, France
Inst Univ France, 103 Blvd St Michel, F-75005 Paris, FranceUniv Grenoble Alpes, F-38000 Grenoble, France