Differential microscopy by conventional electron off-axis holography

被引：10
|
作者：
Tanji, T
Ru, QX
Tonomura, A
机构：
[1] JEOL LTD,JRDC,ERATO,TAKAYANAGI PARTICLE SURFACE PROJECT,AKISHIMA,TOKYO 196,JAPAN
[2] HITACHI LTD,ADV RES LAB,HATOYAMA,SAITAMA 35003,JAPAN
来源：
APPLIED PHYSICS LETTERS | 1996年 / 69卷 / 18期
关键词：
D O I：
10.1063/1.117555
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Differential microscopy is realized by conventional off-axis electron holography with an electron biprism behind the specimen. Two phase images reconstructed from two holograms which are obtained with slightly different potentials of the electron biprism are utilized to make a one-dimensional differential image. Polystyrene latex particles which are charged by electron irradiation are used to demonstrate that the differential image is independent of the distortion of a reference wave. (C) 1996 American Institute of Physics.
引用
收藏
页码：2623 / 2625
页数：3
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