Biaxially aligned high Jc YBCO tapes on YSZ buffer layers deposited by IBAD method

被引：0
|
作者：
Hosaka, M [1 ]
Iijima, Y [1 ]
Sadakata, N [1 ]
Saitoh, T [1 ]
Kohno, O [1 ]
Takeda, K [1 ]
机构：
[1] Fujikura Ltd, Koto Ku, Tokyo 135, Japan
来源：
ADVANCES IN CRYOGENIC ENGINEERING MATERIALS, VOL 44, PTS A AND B | 1998年 / 44卷
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中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
High Jc YBCO thin film tapes were continuously fabricated on flexible Ni-based alloy. Biaxially aligned YBCO films were deposited by PLD on textured YSZ buffer layers formed by using (BAD lion-beam-assisted deposition). For the short sample, Jc value of 1.13x10(6)A/cm(2) (77K, 0T) was obtained and 1.1x10(5)A/cm(2) was maintained at 5T (B perpendicular to c) with measured length of 1cm. For the long sample, Jc value of 2.1x10(5)A/cm(2), and Ic value of 20.8A were obtained (77K, 0T) with measured length of 0.7m. Longitudinal uniformity of the long sample was excellent. Self-field a.c. losses of 0.25m length tapes were measured by a.c. four probe method. The results agreed with Norris' prediction of low a.c. losses for thin strip conductors.
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页码：807 / 813
页数：7
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