AFM in surface finishing: Part IV. Force-distance curves

被引：8
|
作者：
Smith, JR [1 ]
Breakspear, S [1 ]
Fletcher, RJR [1 ]
Campbell, SA [1 ]
机构：
[1] Univ Portsmouth, Sch Pharm & Biomed Sci, Appl Electrochem Grp, Portsmouth PO1 2DT, Hants, England
来源：
TRANSACTIONS OF THE INSTITUTE OF METAL FINISHING | 2005年 / 83卷 / 02期
关键词：
D O I：
10.1179/002029605X38979
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
The use of atomic surface microscope (AFM) to probe surfaces to obtain local physical information by the acquisition of force-distance curves was discussed. It was found that as the AFM tip approaches the surface of interest, the force-distance trace was usually flat (gradient = 0). It was also found that at any point on the loading curve the applied load can be reduced by pulling the probe away from the surface. The results show that AFM is a high resolution imaging tool that can be used to obtain information about surface finishing.
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页码：63 / 67
页数：5
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