Analytical characterization of surfaces by scanning force microscopy

被引：0

作者：

Friedbacher, G ^{[1
]}

Resch, R ^{[1
]}

Schmitz, I ^{[1
]}

Kollensperger, G ^{[1
]}

Schreiner, M ^{[1
]}

Grasserbauer, M ^{[1
]}

机构：

[1] ACAD FINE ARTS, INST CHEM, A-1010 VIENNA, AUSTRIA

来源：

ANNALI DI CHIMICA | 1997年 / 87卷 / 3-4期

关键词：

D O I：

暂无

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

From the analytical chemist's point of view the power of Atomic Force Microscopy (AFM) is based on a unique combination of figures of merit which allow to obtain information not accessible by other analytical techniques. In this presentation background, principles and analytical potential of AFM will be briefly reviewed and then documented by a number of selected examples and applications including characterization of aerosol particles, in-situ studies of thin film deposition and in-situ investigation of glass corrosion.

引用

页码：145 / 163

页数：19

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