Frequency bistability in nonlinear thin-film interferometer

被引:0
|
作者
Glasunova, E. V. [1 ]
Yurevich, V. A. [1 ]
机构
[1] Mogilev State Univ, Mogilyov 212022, BELARUS
关键词
optical bistability; resonant subsurface layer; thin-film cavity;
D O I
10.1117/12.752383
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The bistability in a thin-film cavity system including a layer with the quasi-resonant polarization is considered. Bistability in reflection frequency dependence and arising phase drift can be applicable for creation of chirping mirrors for laser pulses transformation.
引用
收藏
页数:6
相关论文
共 50 条
  • [21] THIN-FILM NONLINEAR-OPTICAL DIODE
    TOCCI, MD
    BLOEMER, MJ
    SCALORA, M
    DOWLING, JP
    BOWDEN, CM
    APPLIED PHYSICS LETTERS, 1995, 66 (18) : 2324 - 2326
  • [22] AMORPHOUS ZNO THIN-FILM NONLINEAR RESISTOR
    IBUKI, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1989, 28 (09): : L1493 - L1494
  • [23] DIRECTED WAVES IN NONLINEAR THIN-FILM CRYSTALS
    NUSSBAUMER, M
    WALTHER, C
    GUNTER, P
    HELVETICA PHYSICA ACTA, 1987, 60 (5-6): : 813 - 813
  • [24] Circuit Modeling of Nonlinear Lossy Frequency-Dependent Thin-Film Magnetic Inductors
    Elsherbini, Adel
    Braunisch, Henning
    O'Brien, Kevin
    Hill, Michael J.
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2014, 4 (01): : 145 - 152
  • [25] FREQUENCY RESPONSE OF THIN-FILM THERMAL DETECTORS
    MASERJIAN, J
    JOURNAL OF APPLIED PHYSICS, 1969, 40 (08) : 3417 - +
  • [26] FREQUENCY CHARACTERISTICS OF THIN-FILM PLANE RESISTOR
    NOGUCHI, S
    TAMKAI, T
    NUNOKAMI, T
    ELECTRONICS & COMMUNICATIONS IN JAPAN, 1969, 52 (02): : 121 - &
  • [27] THEORY OF SELF-PHASE MODULATIONS, OPTICAL SWITCHING, AND TRANSVERSE BISTABILITY IN THE TRANSMISSION OF A LASER THROUGH A NONLINEAR THIN-FILM
    KHOO, IC
    YAN, PY
    LIU, TH
    HOU, JY
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1986, 3 (13) : P31 - P31
  • [28] FREQUENCY RESPONSE OF A THIN-FILM TRANSMISSION LINE
    STANLEY, IW
    BURSLEM, TJ
    ELECTRONICS LETTERS, 1969, 5 (05) : 88 - &
  • [29] A LASER INTERFEROMETER FOR MONITORING THIN-FILM PROCESSES - APPLICATION TO POLYMER DISSOLUTION
    KRASICKY, PD
    GROELE, RJ
    RODRIGUEZ, F
    CHEMICAL ENGINEERING COMMUNICATIONS, 1987, 54 (1-6) : 279 - 299
  • [30] Common-path tandem interferometer for thin-film thickness measurements
    Lin, Shyh-Tsong
    Le, Hoang-Quy
    MEASUREMENT, 2023, 214