Laser-Induced Damage Threshold of Barium Chalcogenides Crystals at 2091 nm

被引:0
|
作者
Kostyukova, N. Yu. [1 ,2 ,3 ,4 ]
Boyko, A. A. [1 ,2 ,3 ]
Eranov, I. D. [5 ]
Kolker, D. B. [1 ,2 ,4 ]
Antipov, O. L. [5 ]
Erushin, E. Yu. [2 ,4 ]
Kostyukov, A. I. [1 ,2 ]
Badikov, D. V. [6 ]
Badikov, V. V. [6 ]
机构
[1] Novosibirsk State Univ, Pirogova 2, Novosibirsk 630090, Russia
[2] Inst Laser Phys SB RAS, Prosp. Akad Lavrentyeva 15b, Novosibirsk 630090, Russia
[3] Special Technol Ltd, Zeljonaja Gorka 1-3, Novosibirsk 630058, Russia
[4] Novosibirsk State Tech Univ, 20 K Marx Av, Novosibirsk 630072, Russia
[5] Russian Acad Sci, Inst Appl Phys, 46 Ulyanov St, Nizhnii Novgorod 603950, Russia
[6] Kuban State Univ, High Technol Lab, 149 Stavropolskaya Str, Krasnodar 350040, Russia
关键词
laser-induced damage threshold (LIDT); barium chalcogenides; NONLINEAR CRYSTALS; BAGA4SE7;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper is devoted to a determination of the 0% probability laser-induced damage threshold of the BaGa4Se7 and BaGa2GeSe6 nonlinear elements by the R-on-1 procedure. A Ho:YAG laser radiation at 2091 nm with pulse duration 13-17 ns and varied pulse repetition rate, 2 kHz, 5 kHz and 10 kHz, was used for testing.
引用
收藏
页数:1
相关论文
共 50 条
  • [1] Laser-induced damage threshold of sulfur-containing crystals of barium chalcogenides
    Erushin, Evgenii
    Badikov, Dmitry
    Anton, Kostyukov
    Boyko, Andrey
    Shevyrdyaeva, Galina
    Safaraliev, Gadzhimet
    Kostyukova, Nadezhda
    APPLIED PHYSICS B-LASERS AND OPTICS, 2025, 131 (01):
  • [2] Femtosecond laser-induced damage threshold of nematic liquid crystals at 1030 nm
    Ramousse, Loic
    Cheriaux, Gilles
    Claudet, Cyrille
    Jullien, Aurelie
    APPLIED OPTICS, 2021, 60 (26) : 8050 - 8056
  • [3] Laser-induced damage threshold of the nonlinear crystals BaGa4Se7 and BaGa2GeSe6 at 2091 nm in the nanosecond regime
    Kostyukova, Nadezhda Yu
    Boyko, Andrey A.
    Eranov, Ilya D.
    Antipov, Oleg L.
    Kolker, Dmitry B.
    Kostyukov, Anton, I
    Erushin, Evgenii Yu
    Miroshnichenko, Ilya B.
    Badikov, Dmitrii, V
    Badikov, Valeriy V.
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 2020, 37 (09) : 2655 - 2659
  • [4] Laser-induced damage threshold of sulfur-containing crystals of barium chalcogenidesLaser-induced damage threshold of sulfur-containing crystals of barium chalcogenidesE. Erushin et al.
    Evgenii Erushin
    Dmitry Badikov
    Kostyukov Anton
    Andrey Boyko
    Galina Shevyrdyaeva
    Gadzhimet Safaraliev
    Nadezhda Kostyukova
    Applied Physics B, 2025, 131 (1)
  • [5] Effect of postgrowth processing technology and laser radiation parameters at wavelengths of 2091 and 1064 nm on the laser-induced damage threshold in ZnGeP2 single crystal
    Yudin, N. N.
    Antipov, O. L.
    Gribenyukov, A., I
    Eranov, I. D.
    Podzyvalov, S. N.
    Zinoviev, M. M.
    Voronin, L. A.
    Zhuravleva, E., V
    Zykova, M. P.
    QUANTUM ELECTRONICS, 2021, 51 (04) : 306 - 316
  • [6] Laser-Induced Damage Threshold Prediction of Dielectric Enhanced Mirrors at 1064 nm
    Wang, Jue
    WINDOW AND DOME TECHNOLOGIES AND MATERIALS XIV, 2015, 9453
  • [7] Laser-induced damage threshold and surface processing of GaN at 400 nm wavelength
    Eliseev, PG
    Sun, HB
    Juodkazis, S
    Sugahara, T
    Sakai, S
    Misawa, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1999, 38 (7B): : L839 - L841
  • [8] Laser-induced damage threshold and surface processing of GaN at 400 nm wavelength
    Eliseev, Petr G.
    Sun, Hong-Bo
    Juodkazis, Saulius
    Sugahara, Tomoya
    Sakai, Shiro
    Misawa, Hiroaki
    Japanese Journal of Applied Physics, Part 2: Letters, 1999, 38 (7 B):
  • [9] Overcoat dependence of laser-induced damage threshold of 355 nm HR coatings
    Zhan, MQ
    He, HB
    Zhao, YN
    Tian, GL
    Shao, JD
    Fan, ZX
    APPLIED SURFACE SCIENCE, 2006, 252 (06) : 2126 - 2130
  • [10] Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals
    Benoît Bussière
    Nicolas Sanner
    Marc Sentis
    Olivier Utéza
    Scientific Reports, 7