Ultrafast structural changes measured by time-resolved X-ray diffraction

被引：107

作者：

Larsson, J

Heimann, PA

Lindenberg, AM

Schuck, PJ

Bucksbaum, PH

Lee, RW

Padmore, HA

Wark, JS

Falcone, RW ^{[1
]}

机构：

[1] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Accelerator & Fus Res, Berkeley, CA 94720 USA

[3] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA

[4] Univ Michigan, Ctr Ultrafast Opt Sci, Ann Arbor, MI 48109 USA

[5] Univ Calif Lawrence Livermore Natl Lab, Livermore, CA 94551 USA

[6] Univ Oxford, Dept Phys, Clarendon Lab, Oxford OX1 3PU, England

[7] Univ Calif Berkeley, Lawrence Berkeley Lab, Ctr Beam Phys, Accelerator & Fus Res Div, Berkeley, CA 94720 USA

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / 06期

关键词：

D O I：

10.1007/s003390050719

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

High-intensity X-ray pulses from third-generation synchrotron sources make it possible to study the temporal dynamics of rapidly evolving materials. We report a study of rapid and reversible disordering of the structure of an InSb crystal induced by an ultrashort laser pulse. A novel crosscorrelation detection technique is described, which allowed us to observe rapid changes in X-ray diffraction that occur on a time-scale of less than 2 ps.

引用

页码：587 / 591

页数：5

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