Time-resolved X-ray diffraction for visualization of atomic motion

被引：0

作者：

Kinoshita, K ^{[1
]}

Ohkubo, T ^{[1
]}

Yoshii, K ^{[1
]}

Harano, H ^{[1
]}

Uesaka, M ^{[1
]}

机构：

[1] Univ Tokyo, Nucl Engn Res Lab, Naka, Ibaraki 3191188, Japan

来源：

INTERNATIONAL JOURNAL OF APPLIED ELECTROMAGNETICS AND MECHANICS | 2001年 / 14卷 / 1-4期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

For ultrafast material analyses, we constructed the time-resolved X-ray diffraction system utilizing ultrashort X-rays from laser produced plasma generated by the 12TW-50fs laser at Nuclear Engineering Research Laboratory. Ultrafast transient changes in laser-irradiated GaAs crystals were observed as X-ray diffraction patterns. A subpeak appears in X-ray diffraction profiles and shifts its position gradually as time goes in the case of 1.3 mJ/mm(2) laser fluence. Experimental results were compared with numerical analyses to infer the atomic arrangement during the transition.

引用

页码：233 / 236

页数：4

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