Electrical and optical properties of thick highly doped p-type GaN layers grown by HVPE

被引:26
|
作者
Usikov, A. [1 ]
Kovalenkov, O. [1 ]
Soukhoveev, V. [1 ]
Ivantsov, V. [1 ]
Syrkin, A. [1 ]
Dmitriev, V. [1 ]
Nikiforov, A. Yu. [2 ]
Sundaresan, S. G. [3 ]
Jeliazkov, S. J. [4 ]
Davydov, A. V. [4 ]
机构
[1] Technol & Devices Int Inc, 12214 Plum Orchard Dr, Silver Spring, MD 20904 USA
[2] Boston Univ, Dept Elect & Comp Engn, Boston, MA 02215 USA
[3] George Mason Univ, Dept Elect & Comp Engn, Fairfax, VA 22030 USA
[4] NIST, Gaithersburg, MD 20899 USA
关键词
D O I
10.1002/pssc.200778685
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this paper we report 3-7 mu m thick p-GaN growth by hydride vapor phase epitaxy (HVPE) on sapphire substrates. Mg impurity was used for doping. As-grown GaN layers had p-type conductivity with concentration N-A-N-D up to 3x10(19) cm(-3). Mg atom concentration was varied from 10(17) to 10(20) cm(-3). Hydrogen concentration was about 10 times less than that for Mg, which may explain effective p-type doping for as-grown GaN layers. Micro-cathodoluminescence revealed a columnar-like structure of the GaN layers with a non-uniform distribution of material regions having dominant 362 nm or 430 nm luminescence. Use of these thick p-GaN layers to grow InGaN-based blue and green LEDs by the HVPE is demonstrated.
引用
收藏
页码:1829 / +
页数:2
相关论文
共 50 条
  • [1] Effect of Capping on Electrical and Optical Properties of GaN Layers Grown by HVPE
    Reshchikov, M. A.
    Usikov, A.
    Helava, H.
    Makarov, Yu.
    Puzyk, M. V.
    Papchenko, B. P.
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2016, 45 (04) : 2178 - 2183
  • [2] Effect of Capping on Electrical and Optical Properties of GaN Layers Grown by HVPE
    M. A. Reshchikov
    A. Usikov
    H. Helava
    Yu. Makarov
    M. V. Puzyk
    B. P. Papchenko
    [J]. Journal of Electronic Materials, 2016, 45 : 2178 - 2183
  • [3] Electrical and optical properties of doped p-type GaN superlattices
    Polyakov, A. Y.
    Smirnov, N. B.
    Govorkov, A. V.
    Dabiran, Amir M.
    Osinsky, A. V.
    Pearton, S. J.
    [J]. APPLIED PHYSICS LETTERS, 2006, 89 (11)
  • [4] GaN layers grown by HVPE on p-type 6H-SiC substrates
    Nikolaev, AE
    Melnik, YV
    Blashenkov, MN
    Kuznetsov, NI
    Nikitina, IP
    Zubrilov, AS
    Tsvetkov, DV
    Nikolaev, VI
    Dmitriev, VA
    Soloviev, VA
    [J]. MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH, 1996, 1 (1-46): : U346 - U352
  • [5] GaN layers grown by HVPE on P-type 6H-SiC substrates
    Ioffe Physical-Technical Institute
    [J]. MRS Internet J. Nitride Semicond. Res., (7d):
  • [6] Properties of Si-doped GaN layers grown by HVPE
    Fomin, AV
    Nikolaev, AE
    Nikitina, IP
    Zubrilov, AS
    Mynbaeva, MG
    Kuznetsov, NI
    Kovarsky, AP
    Ber, BJ
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 2001, 188 (01): : 433 - 437
  • [7] Thick GaN layers grown by HVPE: Influence of the templates
    Ashraf, H.
    Weyher, J. L.
    van Dreumel, G. W. G.
    Gzregorzyck, A.
    Hageman, P. R.
    [J]. JOURNAL OF CRYSTAL GROWTH, 2008, 310 (17) : 3957 - 3963
  • [8] Photoreflectance and photoluminescence of thick GaN layers grown by HVPE
    Kudrawiec, R
    Korbutowicz, R
    Paszkiewicz, R
    Syperek, M
    Misewicz, J
    [J]. OPTO-ELECTRONICS REVIEW, 2004, 12 (04) : 435 - 439
  • [9] Stress evolution in thick GaN layers grown by HVPE
    Lukin, G.
    Meissner, E.
    Friedrich, J.
    Habel, F.
    Leibiger, G.
    [J]. JOURNAL OF CRYSTAL GROWTH, 2020, 550
  • [10] P-type GaN epitaxial layers and AlGaN/GaN heterostructures with high hole concentration and mobility grown by HVPE
    Usikov, A
    Kovalenkov, O
    Ivantsov, V
    Sukhoveev, V
    Dmitriev, V
    Shmidt, N
    Poloskin, D
    Petrov, V
    Ratnikov, V
    [J]. GAN, AIN, INN AND THEIR ALLOYS, 2005, 831 : 453 - 457