CF4 plasma treatment for fabricating high-performance and reliable solid-phase-crystallized poly-Si TFTs

被引:33
|
作者
Wang, SD [1 ]
Lo, WH [1 ]
Lei, TF [1 ]
机构
[1] Natl Chiao Tung Univ, Inst Elect, Hsinchu 30039, Taiwan
关键词
D O I
10.1149/1.1955166
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
A CF4 plasma treatment on solid-phase-crystallized (SPC) poly-Si thin-film transistors ( TFTs ) has been demonstrated. Using this technique, fluorine atoms can be introduced into the poly-Si film to passivate the defects, and hence, the device performance of the SPC poly-Si TFTs can be significantly improved. The fluorinated SPC poly- Si TFTs exhibit a good subthreshold slope, low threshold voltage, and high field effect mobility. Moreover, the fluorinated SPC poly- Si TFTs also exhibit an improved hot-carrier-stress immunity, which is due to the strong Si-F bonds formed in the poly-Si channel region. (c) 2005 The Electrochemical Society.
引用
收藏
页码:G703 / G706
页数:4
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