Measurement of characteristic X-rays by positron impact

被引：5
|
作者：
Nagashima, Y
Saito, F
Itoh, Y
Goto, A
Hyodo, T
机构：
[1] Univ Tokyo, Grad Sch Arts & Sci, Inst Phys, Meguro Ku, Tokyo 1538902, Japan
[2] RIKEN, Wako, Saitama 3510198, Japan
来源：
POSITRON ANNIHILATION, ICPA-13, PROCEEDINGS | 2004年 / 445-6卷
关键词：
characteristic X-rays; inner-shell ionization cross-section;
D O I：
10.4028/www.scientific.net/MSF.445-446.440
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
An X-ray detector with thin Si(Li) crystals has been fabricated and employed to detect the characteristic X-rays by positron impact. Use of thin detector crystals is essential for the measurements of the characteristic X-rays induced by positron impact. Otherwise the background produced in the crystals by the annihilation gamma-rays is too large to isolate the X-ray peaks. The data has been analyzed to obtain the inner-shell ionization cross sections by positron impact.
引用
收藏
页码：440 / 442
页数：3
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