A measurement of the polarization of secondary X-rays

被引：19

|

作者：

Compton, AH

Hagenow, CF

机构：

[1] Univ Chicago, Chicago, IL USA

[2] Washington Univ, St Louis, MO USA

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS | 1924年 / 8卷 / 04期

关键词：

D O I：

10.1364/JOSA.8.000487

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：487 / 491

页数：5

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