Latchup immunity is a challenging issue for the design of power supply clamps used in high-voltage electrostatic discharge (ESD) protection applications. While silicon-controlled rectifiers (SCRs) are highly robust ESD devices, they are traditionally not suited for high-voltage ESD due to their inherent low holding voltage and, thus, vulnerability to latchup. In this letter, a novel SCR stacking structure with an extremely high holding voltage, very small snapback, and acceptable failure current has been developed. The new and existing high holding voltage ESD devices are also compared to demonstrate the advancement of this work.
机构:
Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian UniversityKey Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University
ZHANG Peng
WANG Yuan
论文数: 0引用数: 0
h-index: 0
机构:
Key Laboratory of Microelectronic Devices and Circuits,Institute of Microelectronics,Peking UniversityKey Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University
WANG Yuan
ZHANG Xing
论文数: 0引用数: 0
h-index: 0
机构:
Key Laboratory of Microelectronic Devices and Circuits,Institute of Microelectronics,Peking UniversityKey Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University
ZHANG Xing
MA XiaoHua
论文数: 0引用数: 0
h-index: 0
机构:
Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian UniversityKey Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University
MA XiaoHua
HAO Yue
论文数: 0引用数: 0
h-index: 0
机构:
Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian UniversityKey Laboratory of Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University
机构:
Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
Zhang Peng
Wang Yuan
论文数: 0引用数: 0
h-index: 0
机构:
Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
Wang Yuan
Zhang Xing
论文数: 0引用数: 0
h-index: 0
机构:
Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
Zhang Xing
Ma XiaoHua
论文数: 0引用数: 0
h-index: 0
机构:
Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
Ma XiaoHua
Hao Yue
论文数: 0引用数: 0
h-index: 0
机构:
Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaXidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China