Electron refraction in ballistic electron-emission microscopy studied by a superlattice energy filter

被引：21

作者：

Smoliner, J ^{[1
]}

Heer, R ^{[1
]}

Eder, C ^{[1
]}

Strasser, G ^{[1
]}

机构：

[1] Vienna Tech Univ, Inst Festkorperelekt & Mikrostukturzentrum, A-1040 Vienna, Austria

来源：

PHYSICAL REVIEW B | 1998年 / 58卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.58.R7516

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Buried Al0.4Ga0.6As/GaAs superlattices on Au-GaAs Schottky diodes have been used as an energy filter to study the energetic current distribution in ballistic electron-emission microscopy (BEEM) at room temperature and T = 100 K. Due to the large difference in electron masses in Au and GaAs we find that parallel momentum conservation leads to considerable electron refraction at the Au-GaAs interface. As a consequence, the energetic distribution of the ballistic electron current is inverted beyond the Au-GaAs interface and an almost linear behavior of the BEEM spectrum is observed in the energetic regime of the superlattice miniband. [S0163-1829(98)51136-8].

引用

页码：R7516 / R7519

页数：4

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