Electron refraction in ballistic electron-emission microscopy studied by a superlattice energy filter

被引：21
|
作者：
Smoliner, J [1 ]
Heer, R [1 ]
Eder, C [1 ]
Strasser, G [1 ]
机构：
[1] Vienna Tech Univ, Inst Festkorperelekt & Mikrostukturzentrum, A-1040 Vienna, Austria
来源：
PHYSICAL REVIEW B | 1998年 / 58卷 / 12期
关键词：
D O I：
10.1103/PhysRevB.58.R7516
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Buried Al0.4Ga0.6As/GaAs superlattices on Au-GaAs Schottky diodes have been used as an energy filter to study the energetic current distribution in ballistic electron-emission microscopy (BEEM) at room temperature and T = 100 K. Due to the large difference in electron masses in Au and GaAs we find that parallel momentum conservation leads to considerable electron refraction at the Au-GaAs interface. As a consequence, the energetic distribution of the ballistic electron current is inverted beyond the Au-GaAs interface and an almost linear behavior of the BEEM spectrum is observed in the energetic regime of the superlattice miniband. [S0163-1829(98)51136-8].
引用
收藏
页码：R7516 / R7519
页数：4
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