Dynamical observation of photo-Dember effect on semi-insulating GaAs using femtosecond core-level photoelectron spectroscopy

被引:3
|
作者
Oguri, Katsuya [1 ]
Tsunoi, Takanobu [1 ]
Kato, Keiko [1 ]
Nakano, Hidetoshi [1 ]
Nishikawa, Tadashi [1 ]
Tateno, Kouta [1 ]
Sogawa, Tetsuomi [1 ]
Gotoh, Hideki [1 ]
机构
[1] NTT Corp, NTT Basic Res Labs, Atsugi, Kanagawa 2430198, Japan
关键词
PHOTOEMISSION; LASER; EMISSION;
D O I
10.7567/APEX.8.022401
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigated ultrafast photogenerated carrier dynamics on a semi-insulating GaAs surface using femtosecond time-resolved core-level photoelectron spectroscopy. We observed a transient change in the surface potential where the Ga-3d core-level peak instantaneously shifted by similar to 350 meV toward a higher binding energy within 2 ps of a 100 fs laser irradiation. A comparison of the experimental results with numerical simulations based on a drift-diffusion model of a semi-insulating semiconductor revealed that the transient surface potential change was mainly due to the photo-Dember effect, whereby the large difference in the carrier diffusion between the electron and hole instantaneously induced a surface photovoltage. (C) 2015 The Japan Society of Applied Physics
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页数:4
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