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- [2] High quality robust tests for path delay faults 15TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1997, : 88 - 93
- [3] Methods for testing path delay and static faults in RSFQ circuits 2022 IEEE 40TH VLSI TEST SYMPOSIUM (VTS), 2022,
- [4] On testing the path delay faults of a microprocessor using its instruction set Proceedings of the IEEE VLSI Test Symposium, 2000, : 15 - 20
- [5] On classification of path delay faults in two-vector testing mode FIFTH INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN & COMPUTER GRAPHICS, VOLS 1 AND 2, 1997, : 566 - 571
- [9] On the Reuse of Timing Resilient Architecture for Testing Path Delay Faults in Critical Paths PROCEEDINGS OF THE 2018 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2018, : 379 - 384
- [10] Efficient path selection for delay testing based on partial path evaluation 16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1998, : 188 - 193