CHARACTERIZATION OF EPITAXIAL ZrO2 BY X-RAY DIFFRACTOMETRY WITH PARALLEL BEAM GEOMETRY

被引：0
|
作者：
Guinebretiere, R. [1 ]
Dauger, A. [1 ]
Masson, O. [1 ]
Soulestin, B. [1 ]
机构：
[1] UA CNRS 320 ENSCI 47, Lab Mat Ceram & Traitements Surfaces, F-87065 Limoges, France
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1996年 / 52卷
关键词：
D O I：
10.1107/S0108767396085091
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
PS10.01.08
引用
收藏
页码：C361 / C361
页数：1
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