CHARACTERIZATION OF EPITAXIAL ZrO2 BY X-RAY DIFFRACTOMETRY WITH PARALLEL BEAM GEOMETRY

被引：0
|
作者：
Guinebretiere, R. [1 ]
Dauger, A. [1 ]
Masson, O. [1 ]
Soulestin, B. [1 ]
机构：
[1] UA CNRS 320 ENSCI 47, Lab Mat Ceram & Traitements Surfaces, F-87065 Limoges, France
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1996年 / 52卷
关键词：
D O I：
10.1107/S0108767396085091
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
PS10.01.08
引用
收藏
页码：C361 / C361
页数：1
相关论文
共 50 条
  • [21] X-RAY DETERMINATION OF TRANSFORMATION DEPTHS IN CERAMICS CONTAINING TETRAGONAL ZRO2
    KOSMAC, T
    WAGNER, R
    CLAUSSEN, N
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1981, 64 (04) : C72 - C73
  • [22] Recent advances in the characterization of amorphous pharmaceuticals by X-ray diffractometry
    Thakral, Seema
    Terban, Maxwell W.
    Thakral, Naveen K.
    Suryanarayanan, Raj
    ADVANCED DRUG DELIVERY REVIEWS, 2016, 100 : 183 - 193
  • [23] Characterization of ALCVD-Al2O3 and ZrO2 layer using X-ray photoelectron spectroscopy
    Nohira, H
    Tsai, W
    Besling, W
    Young, E
    Petry, J
    Conard, T
    Vandervorst, W
    De Gendt, S
    Heyns, M
    Maes, J
    Tuominen, M
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2002, 303 (01) : 83 - 87
  • [24] X-ray and thermal analysis of nanostructured ZrO2 and Y2O3-ZrO2 ceramics
    Ramamoorthy, R
    Viswanath, RN
    Ramasamy, S
    BULLETIN OF ELECTROCHEMISTRY, 1996, 12 (3-4): : 133 - 135
  • [25] X-ray and thermal analysis of nanostructured ZrO2 and Y2O3-ZrO2 ceramics
    Bull Electrochem, 3/4 (133):
  • [26] CHARACTERIZATION OF THIN EPITAXIAL CAF2 LAYERS ON SI(111) USING IMPURITY LUMINESCENT PROBES, X-RAY STANDING WAVES AND X-RAY-DIFFRACTOMETRY
    ALVAREZ, JC
    HIRANO, K
    KAZIMIROV, AY
    KOVALCHUK, MV
    KREINES, AY
    SOKOLOV, NS
    YAKOVLEV, NL
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1992, 7 (12) : 1431 - 1436
  • [27] X-ray photoelectron spectroscopy study of ZrO2/TiO2/Si stack
    Zhu, L. Q.
    Zhang, L. D.
    Fang, Q.
    APPLIED PHYSICS LETTERS, 2007, 91 (17)
  • [28] FLUORESCENT SOURCES FOR X-RAY DIFFRACTOMETRY
    PARRISH, W
    LOWITZSCH, K
    SPIELBERG, N
    ACTA CRYSTALLOGRAPHICA, 1958, 11 (06): : 400 - 405
  • [29] An X-ray photoelectron spectroscopy study of the stability of ZrO2 films on Pd(110)
    Guo, Q
    Joyner, RW
    APPLIED SURFACE SCIENCE, 1999, 144-45 : 375 - 379
  • [30] Effect of phase composition on X-ray absorption spectra of ZrO2 thin films
    Kikas, A.
    Aarik, J.
    Kisand, V.
    Kooser, K.
    Kaambre, T.
    Manar, H.
    Uustare, T.
    Rammula, R.
    Sammelselg, V.
    Martinson, I.
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2007, 156 : LXXIX - LXXIX
12345