Between X and Y: how process tracing contributes to opening the black box of causality

被引:116
|
作者
Trampusch, Christine [1 ]
Palier, Bruno [2 ]
机构
[1] Univ Cologne, Cologne Ctr Comparat Polit, Cologne, Germany
[2] SciencesPo, Ctr Etud Europeennes, LIEPP, Paris, France
关键词
Process tracing; method; methodology; ontology; causality; SYSTEMATIC PROCESS ANALYSIS; MECHANISMS; STANDARD;
D O I
10.1080/13563467.2015.1134465
中图分类号
F [经济];
学科分类号
02 ;
摘要
This article maps the methodological debate on process tracing and discusses the diverse variants of process tracing in order to highlight the commonalities beyond diversity and disagreements. Today most authors agree that process tracing is aimed at unpacking causal and temporal mechanisms. The article distinguishes two main types of use for process tracing. Some are more inductive, aimed at theory building (i.e. at uncovering and specifying causal mechanisms) while others are more deductive, aimed at theory testing (and refining). The paper summarizes the main added value and drawbacks of process tracing. It ends by providing ten guidelines for when and how to apply process tracing.
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页码:437 / 454
页数:18
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