Vision-based Mura detection for TFT-LCD panel

被引：0
|
作者：
Kwak, DM [1 ]
Kim, WS [1 ]
Choi, DH [1 ]
Song, YC [1 ]
Park, KH [1 ]
机构：
[1] Kyungpook Natl Univ, Sch Elect Engn & Comp Sci, Taegu 702701, South Korea
来源：
CCCT 2003, VOL 4, PROCEEDINGS: COMPUTER, COMMUNICATION AND CONTROL TECHNOLOGIES: I | 2003年
关键词：
inspection; LCD; Mura; DFB;
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
In this paper, an automated inspection algorithm for the detection of Mura defects in TFT-LCD panel is presented. Considering simplicity, Mura defects of TFT-LCD panel are classified into blob-Mura and line-Mura. To detect blob-Mura, we use an adapted multilevel-thresholding technique in local area of preprocessed image which brightness varies nonlinearly. DFB (Directional Filter Bank) is also used to find line-Mura. The experimental results using 60 sample images show that the proposed algorithm gave promising results for applying automated inspection technique for TFT-LCD panel.
引用
收藏
页码：199 / 203
页数：5
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