Vision-based Mura detection for TFT-LCD panel

被引：0

作者：

Kwak, DM ^{[1
]}

Kim, WS ^{[1
]}

Choi, DH ^{[1
]}

Song, YC ^{[1
]}

Park, KH ^{[1
]}

机构：

[1] Kyungpook Natl Univ, Sch Elect Engn & Comp Sci, Taegu 702701, South Korea

来源：

CCCT 2003, VOL 4, PROCEEDINGS: COMPUTER, COMMUNICATION AND CONTROL TECHNOLOGIES: I | 2003年

关键词：

inspection; LCD; Mura; DFB;

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

In this paper, an automated inspection algorithm for the detection of Mura defects in TFT-LCD panel is presented. Considering simplicity, Mura defects of TFT-LCD panel are classified into blob-Mura and line-Mura. To detect blob-Mura, we use an adapted multilevel-thresholding technique in local area of preprocessed image which brightness varies nonlinearly. DFB (Directional Filter Bank) is also used to find line-Mura. The experimental results using 60 sample images show that the proposed algorithm gave promising results for applying automated inspection technique for TFT-LCD panel.

引用

页码：199 / 203

页数：5

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