Leakage Flux based turn-to-turn Fault Detection for Shunt Inductor

被引：0
|
作者：
Chen, R. [1 ]
Dong, J. [1 ]
Tian, C. [1 ]
Chen, Q. [1 ]
机构：
[1] Wuhan Univ, Wuhan, Hubei, Peoples R China
来源：
2018 IEEE INTERNATIONAL MAGNETIC CONFERENCE (INTERMAG) | 2018年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页数：2
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