Adaptive Granularity On-die ECC

被引：2
|
作者：
Kim, Daero [1 ]
Kim, Jungrae [1 ]
机构：
[1] Sungkyunkwan Univ, Dept Semicond & Display Engn, Suwon, South Korea
来源：
2022 19TH INTERNATIONAL SOC DESIGN CONFERENCE (ISOCC) | 2022年
基金：
新加坡国家研究基金会;
关键词：
error correction codes; reliability; DRAM;
D O I：
10.1109/ISOCC56007.2022.10031324
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
DRAM vendors have introduced on-die ECC (Error Correction Codes) to protect memory from errors. The current on-die ECC provides weak Single Error Correction (SEC) protection, yet growing errors demand stronger protection. This paper proposes a novel memory protection scheme called Adaptive Granularity On-die ECC (AGO-ECC). AGO-ECC adjusts access granularity and ECC protection strength based on memory locality and reliability requirements. For critical or high-locality data, AGO-ECC increases the granularity and applies Triple Error Correction (TEC). AGO-ECC can improve not only reliability but also performance.
引用
收藏
页码：318 / 319
页数：2
相关论文
共 50 条
  • [31] On-die decoupling capacitor measurement using Vector Network Analyzer
    Guo, Fei
    Frankovich, Mark
    ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING, 2006, : 25 - +
  • [32] 浅析Cache On-Die与Cache Off-Die技术优劣
    机器猫
    广东电脑与电讯, 2000, (05) : 66 - 69
  • [33] On-die Supply-inducecd Jitter Behavioral Modeling
    Wang, Xiaoqing
    Martin, Aaron
    2013 IEEE 22ND CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS (EPEPS), 2013, : 147 - 150
  • [34] An On-die Oscilloscope for System-Level ESD Noise Monitoring
    Lee, Wooryong
    Park, Junsik
    Kim, Jingook
    Ryu, Chunghyun
    Lee, Jongsung
    Kang, Bonggyu
    Bae, Bumhee
    2019 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY (EMC+SIPI), 2019, : 156 - 160
  • [35] Frequency properties of on-die power distribution network in VLSI circuits
    Livshits, Pavel
    Fefer, Yefim
    Rozen, Anton
    Shapira, Yoram
    MICROELECTRONIC ENGINEERING, 2010, 87 (09) : 1760 - 1763
  • [36] On-die droop detector for analog sensing of power supply noise
    Muhtaroglu, A
    Taylor, G
    Rahal-Arabi, T
    Callahan, K
    2003 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS, 2003, : 193 - 196
  • [37] On-die parameter extraction from path-delay measurements
    Takahashi, Tomoyuki
    Uezono, Takumi
    Shintani, Michihiro
    Masu, Kazuya
    Sato, Takashi
    2009 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC), 2009, : 101 - 104
  • [38] A Simple System for on-die Measurement of atto-Farad Capacitance
    Baruch, Ezra
    Shperber, Shai
    Levy, Rinatya
    Weizman, Yoav
    Fridburg, Jacob
    Marks, Rachel
    2011 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS), 2011,
  • [39] Local Oscillations of On-Die Supply Voltage-A Reliability Issue
    Gurfinkel, Moshe
    Livshits, Pavel
    Rozen, Anton
    Fefer, Yefim
    Bernstein, Joseph B.
    Shapira, Yoram
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2009, 9 (03) : 476 - 482
  • [40] Inter-Symbol Interference (ISI) in on-die transmission lines
    Rysin, A.
    Livshits, P.
    Sofer, S.
    Mantel, O.
    Shapira, Y.
    Fefer, Y.
    IEEE INTERNATIONAL CONFERENCE ON MICROWAVES, COMMUNICATIONS, ANTENNAS AND ELECTRONICS SYSTEMS (COMCAS 2009), 2009,
12345