Adaptive Granularity On-die ECC

被引：2
|
作者：
Kim, Daero [1 ]
Kim, Jungrae [1 ]
机构：
[1] Sungkyunkwan Univ, Dept Semicond & Display Engn, Suwon, South Korea
来源：
2022 19TH INTERNATIONAL SOC DESIGN CONFERENCE (ISOCC) | 2022年
基金：
新加坡国家研究基金会;
关键词：
error correction codes; reliability; DRAM;
D O I：
10.1109/ISOCC56007.2022.10031324
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
DRAM vendors have introduced on-die ECC (Error Correction Codes) to protect memory from errors. The current on-die ECC provides weak Single Error Correction (SEC) protection, yet growing errors demand stronger protection. This paper proposes a novel memory protection scheme called Adaptive Granularity On-die ECC (AGO-ECC). AGO-ECC adjusts access granularity and ECC protection strength based on memory locality and reliability requirements. For critical or high-locality data, AGO-ECC increases the granularity and applies Triple Error Correction (TEC). AGO-ECC can improve not only reliability but also performance.
引用
收藏
页码：318 / 319
页数：2
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