ACTIVE BOOST IN THE QUALITY FACTOR OF AN ALN MEMS RESONATOR UP TO 165,000

被引:0
|
作者
Xu, Changting [1 ]
Piazza, Gianluca [2 ]
机构
[1] Qualcomm Technol Inc, Santa Clara, CA 95051 USA
[2] Carnegie Mellon Univ, Pittsburgh, PA 15213 USA
关键词
D O I
10.1109/memsys.2019.8870900
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work reports a method to boost the quality factor (Q, defined as the ratio of the resonant frequency to the 3-dB bandwidth) of a 55 MHz AlN MEMS contour-mode resonator (CMR) from similar to 1.000 to >165,000. The resulting resonator exhibits an f-Q product of 8.8x10(12) comparable to quartz crystals (similar to 3x10(13) Hz). This significant. progress is accomplished by pumping energy into the resonator through an externally applied force that has a specific phase relationship with respect to the driving voltage source. This method overcomes the fundamental limit of AlN f-Q product using a finite amount of external power. We further validated this concept and showed more than 12 dB improvement in phase noise of an oscillator built using the Q-boosted resonator. Comparing with other active Q-boosting methods, this technique has the advantage that it intrinsically avoids self-oscillations. We demonstrated an interesting approach to improve the performance of AlN CMRs for timing applications.
引用
收藏
页码:907 / 910
页数:4
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