Advanced characterization of a stress corrosion crack from an in-field serviced X-52 steel line pipe

被引:0
|
作者
Li, J [1 ]
Elboujdaini, M [1 ]
Gertsman, VY [1 ]
Gao, M [1 ]
Katz, DC [1 ]
机构
[1] Canada Ctr Mineral & Energy Technol, Mat Technol Lab, Ottawa, ON K1A 0G1, Canada
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中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
Analysis of stress corrosion cracking (SCC) usually involves high-end analytical tools including scanning electron microscope (SEM) and analytical transmission electron microscope (TEM). In recent years, focused ion beam microscope (FIB) has found many applications in materials science fields. In this study, high-resolution FIB images have shown details of crack morphology and a plan-view TEM specimen containing the selected crack-tip was successfully prepared. The preparation of cross-sectioned samples containing crack tips was of paramount importance for subsequent TEM analyses.
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页码:515 / 523
页数:9
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