Numerical correction for secondary fluorescence across phase boundaries in EPMA

被引：0

作者：

Escuder, J. A. ^{[1
]}

Salvat, F. ^{[1
]}

Llovet, X. ^{[2
]}

Donovan, J. J. ^{[3
]}

机构：

[1] Univ Barcelona, Fac Fis ECM, ES-08028 Barcelona, Spain

[2] Univ Barcelona, Serv Cient Tecn, E-08028 Barcelona, Spain

[3] Univ Oregon, COMCOR, Dept Chem, Eugene, OR 97403 USA

来源：

PROCEEDINGS OF THE 11TH EUROPEAN WORKSHOP OF THE EUROPEAN-MICROBEAM-ANALYSIS-SOCIETY (EMAS) ON MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS | 2010年 / 7卷

关键词：

MICROPROBE ANALYSIS;

D O I：

10.1088/1757-899X/711/012008

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A fast calculation method to compute secondary fluorescence near phase boundaries in electron probe microanalysis is described. Secondary fluorescence intensities are calculated by numerically integrating the equations that describe the emission of fluorescence by photoelectric absorption of primary X-rays (characteristic and bremsstrahlung) from a couple of two semi-infinite, adjacent materials, when the electron beam impacts on one of them. The reliability of the developed calculation is assessed by comparing calculated fluorescence k-ratios, as functions of the distance of the electron beam to the interface, with experimental data available in the literature and with the results of Monte Carlo simulation using code PENELOPE.

引用

页数：7

共 50 条

[11] Mass transfer studies with laser-induced fluorescence across liquid/liquid phase boundaries
Baumann, KH
Mühlfriedel, K
CHEMICAL ENGINEERING & TECHNOLOGY, 2002, 25 (07) : 697 - 700
[12] ELECTROCHEMICAL TRANSFER ACROSS PHASE BOUNDARIES
CORISH, J
WARDE, CJ
BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1978, 82 (03): : 282 - 291
[13] Secondary fluorescence effect quantification of EPMA analyses of olivine grains embedded in basaltic glass
Gavrilenko, Maxim
Batanova, Valentina G.
Llovet, Xavier
Krasheninnikov, Stepan
Koshlyakova, Alina N.
V. Sobolev, Alexander
CHEMICAL GEOLOGY, 2023, 621
[14] RETRACTED: Influence of secondary fluorescence on the analysis of olivine grains in chromite and in glass by EPMA (Retracted Article)
Sonina, Olga G.
Llovet, Xavier
GEOCHEMISTRY, 2021, 81 (02):
[15] SLIP TRANSFER ACROSS GRAIN AND PHASE BOUNDARIES
WERNER, E
PRANTL, W
ACTA METALLURGICA ET MATERIALIA, 1990, 38 (03): : 533 - 537
[16] Monte Carlo simulation of NbKα secondary fluorescence in EPMA:: comparison of PENELOPE simulations with experimental results
Fournelle, JH
Kim, S
Perepezko, JH
SURFACE AND INTERFACE ANALYSIS, 2005, 37 (11) : 1012 - 1016
[17] Correction of secondary X-ray fluorescence near grain boundaries in electron microprobe analysis: Application to thermobarometry of spinel lherzolites
Llovet, X
Galan, G
AMERICAN MINERALOGIST, 2003, 88 (01) : 121 - 130
[18] Stochastic dynamics of single molecules across phase boundaries
Bo, Stefano
Hubatsch, Lars
Bauermann, Jonathan
Weber, Christoph A.
Juelicher, Frank
PHYSICAL REVIEW RESEARCH, 2021, 3 (04):
[19] Piezoelectricity across 2D Phase Boundaries
Puthirath, Anand B.
Zhang, Xiang
Krishnamoorthy, Aravind
Xu, Rui
Samghabadi, Farnaz Safi
Moore, David C.
Lai, Jiawei
Zhang, Tianyi
Sanchez, David E.
Zhang, Fu
Glavin, Nicholas R.
Litvinov, Dmitri
Vajtai, Robert
Swaminathan, Venkataraman
Terrones, Mauricio
Zhu, Hanyu
Vashishta, Priya
Ajayan, Pulickel M.
ADVANCED MATERIALS, 2022, 34 (39)
[20] SECONDARY FLUORESCENCE CORRECTION IN THICK TARGET PIXE ANALYSIS
SMIT, Z
BUDNAR, M
CINDRO, V
RAVNIKAR, M
RAMSAK, V
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1985, 228 (2-3): : 482 - 489

← 1 2 3 4 5 →