Study of the local atomic structure of a silver aluminum alloy by the method of extended electron energy loss fine structure (EELFS)

被引:0
|
作者
Shamin, VA [1 ]
Kadikova, AK [1 ]
Deev, AN [1 ]
Rats, YV [1 ]
机构
[1] Russian Acad Sci, Inst Physicotech, Ural Branch, Izhevsk 426001, Russia
关键词
Aluminum Alloy; Binary Alloy; Interatomic Distance; Pure Aluminum; Radial Distribution Function;
D O I
10.1134/1.1130486
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Extended energy loss fine structure spectra are obtained for electrons at the Al K and Ag M-4,M-5 edges for an Al-20 wt %Ag solid solution after high-temperature aging, as well as for the pure alloy components. The analysis layer depth was similar to 20 Angstrom. Radial distribution functions for the atoms are determined by Fourier transforming these spectra with a correction for the phase shift and the method of regularization. For pure aluminum and silver it is found that the position of the first coordinate spheres does not differ from bulk interatomic distances. For the binary alloy it was shown that the state of the sample corresponds to a decomposed solid solution with inclusions of a phase enriched with silver against an aluminum host background. The interatomic Al-Al distances in the binary alloy correspond to the length of a pure aluminum bond. The partial distances to the first two coordination spheres for the pairs Ag-Ag, Ag-Al are the same and equal the interatomic distances of the gamma-phase Ag2Al. (C) 1998 American Institute of Physics.
引用
收藏
页码:1056 / 1061
页数:6
相关论文
共 50 条
  • [41] ANALYTICAL ELECTRON-MICROSCOPY USING EXTENDED ENERGY-LOSS FINE-STRUCTURE (EXELFS)
    JOHNSON, DE
    CSILLAG, S
    STERN, EA
    SCANNING ELECTRON MICROSCOPY, 1981, : 105 - 115
  • [42] REACTION AND STRUCTURE OF TI ON SI PROBED BY SURFACE EXTENDED ENERGY-LOSS FINE-STRUCTURE AND EXTENDED APPEARANCE POTENTIAL FINE-STRUCTURE
    IDZERDA, YU
    WILLIAMS, ED
    EINSTEIN, TL
    PARK, RL
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04): : 847 - 851
  • [43] Identification of different forms of carbon by extended energy loss fine structure
    Moller, AD
    Araiza, LC
    delaGarza, LM
    Hirata, GA
    Galvan, DH
    Borja, MA
    APPLIED SURFACE SCIENCE, 1997, 108 (01) : 59 - 63
  • [44] Analysis of surface extended energy loss fine structure of zinc oxide
    Konishi, Ryosuke
    Arioka, Masato
    Kobayashi, Yasuhiro
    Sasakura, Hiroshi
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1988, 27 (07): : 1347 - 1348
  • [45] STRATEGIES FOR DETERMINATION OF INTER-ATOMIC DISTANCES FROM EXTENDED ENERGY-LOSS FINE-STRUCTURE
    TAFRESHI, MA
    CSILLAG, S
    ZOU, WY
    BOHM, C
    MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1991, 2 (05): : 515 - 530
  • [46] SURFACE EXTENDED ELECTRON LOSS FINE-STRUCTURE - DEPENDENCE ON INCIDENT ELECTRON-ENERGY AND COLLECTION SOLID ANGLE
    IDZERDA, YU
    WILLIAMS, ED
    EINSTEIN, TL
    PARK, RL
    SURFACE SCIENCE, 1985, 160 (01) : 75 - 86
  • [47] Application of extended energy loss fine structure in determining the structure of amorphous SiO2
    Ito, Y
    Winkler, D
    Jain, H
    Williams, DB
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1997, 222 : 83 - 93
  • [48] Obtaining surface local atomic structure bond lengths from secondary electron extended fine structure: Inverse problem setting and solving for copper
    Guy, DE
    Deev, AN
    Ruts, YV
    Grebennikov, VI
    Sokolov, OB
    SURFACE REVIEW AND LETTERS, 1997, 4 (05) : 947 - 949
  • [49] PROBING THE LOCAL ATOMIC ENVIRONMENT AT THE INTERFACES IN THE FE-SI SYSTEM BY THE SURFACE-EXTENDED ENERGY-LOSS FINE-STRUCTURE TECHNIQUE
    ZENG, HS
    WALLART, X
    NYS, JP
    DALMAI, G
    FRIEDEL, P
    PHYSICAL REVIEW B, 1991, 44 (24): : 13811 - 13814
  • [50] STRUCTURAL STUDY OF AMORPHOUS HYDROGENATED AND UNHYDROGENATED TITANIUM CARBIDE THIN-FILMS BY EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE AND EXTENDED ELECTRON-ENERGY-LOSS FINE-STRUCTURE
    KALOYEROS, AE
    WILLIAMS, WS
    BROWN, FC
    GREENE, AE
    WOODHOUSE, JB
    PHYSICAL REVIEW B, 1988, 37 (02): : 771 - 784