ANALYTICAL ELECTRON-MICROSCOPY USING EXTENDED ENERGY-LOSS FINE-STRUCTURE (EXELFS)

被引：0
|
作者：
JOHNSON, DE [1 ]
CSILLAG, S [1 ]
STERN, EA [1 ]
机构：
[1] UNIV WASHINGTON,DEPT PHYS,SEATTLE,WA 98195
来源：
SCANNING ELECTRON MICROSCOPY | 1981年
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中图分类号：
TH742 [显微镜];
学科分类号：
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页码：105 / 115
页数：11
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