Multilayered nanoscale systems and atomic force microscopy mechanical measurements

The atomic force microscopy approach developed for the microindentation of layered elastic solids was adapted to analyze nanoprobing of ultrathin (1-10 nm thick) polymer films on a solid substrate. This "graded" approach offered a transparent consideration of the gradient of the mechanical properties between layers with different elastic properties. Some examples of recent applications of this model to nanoscale polymer layers were presented. We considered polymer layers with elastic moduli ranging from 0.1 to 20 MPa in a solvated state. A complex shape of corresponding loading curves and elastic modulus depth profiles obtained from experimental data were fitted by the graded functions suggested.