Piezoelectric measurements with atomic force microscopy

被引：0
|
作者：
Christman, J.A. [1 ]
Maiwa, H. [2 ]
Kim, S.-H. [2 ]
Kingon, A.I. [2 ]
Nemanich, R.J. [1 ]
机构：
[1] Department of Physics, North Carolina State University, Raleigh, NC 27695, United States
[2] Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, United States
来源：
Materials Research Society Symposium - Proceedings | 1999年 / 541卷
关键词：
Atomic force microscopy - Conductive materials - Electric fields - Electric potential - Electric variables measurement - Electrodes - Hysteresis - Measurement errors - Piezoelectricity - Single crystals - Zirconia;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：617 / 622
相关论文
共 50 条
  • [1] Piezoelectric measurements with atomic force microscopy
    Christman, JA
    Woolcott, RR
    Kingon, AI
    Nemanich, RJ
    APPLIED PHYSICS LETTERS, 1998, 73 (26) : 3851 - 3853
  • [2] Piezoelectric measurements with atomic force microscopy
    Christman, JA
    Maiwa, H
    Kim, SH
    Kingon, AI
    Nemanich, RJ
    FERROELECTRIC THIN FILMS VII, 1999, 541 : 617 - 622
  • [3] Uncertainty of atomic force microscopy measurements
    Gotszalk, Teodor P.
    Janus, Pawel
    Marendziak, Andrzej
    Szeloch, Roman F.
    OPTICA APPLICATA, 2007, 37 (04) : 397 - 403
  • [4] Piezoelectric sensor for detecting force gradients in atomic force microscopy
    Itoh, Toshiro
    Suga, Tadatomo
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1994, 33 (1 A): : 334 - 340
  • [5] Simultaneous force and conduction measurements in atomic force microscopy
    Lantz, MA
    O'Shea, SJ
    Welland, ME
    PHYSICAL REVIEW B, 1997, 56 (23) : 15345 - 15352
  • [6] Simultaneous force and conduction measurements in atomic force microscopy
    Phys Rev B, 23 (15 345):
  • [7] Application of atomic force microscopy in adhesion force measurements
    Hassani, Sedigheh Sadegh
    Daraee, Maryam
    Sobat, Zahra
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2021, 35 (03) : 221 - 241
  • [8] Inverted atomic force microscopy for force measurements.
    Chan, S
    Idowu, A
    Mabry, C
    Green, JB
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2004, 227 : U500 - U500
  • [9] Investigations into local piezoelectric properties by atomic force microscopy
    Durkan, C
    Chu, DP
    Migliorato, P
    Welland, ME
    APPLIED PHYSICS LETTERS, 2000, 76 (03) : 366 - 368
  • [10] Piezoelectric hysteresis measurement using atomic force microscopy
    Shin, H
    Shin, JK
    Hong, SB
    Jeon, JU
    Song, HW
    Hong, JI
    No, K
    INTEGRATED FERROELECTRICS, 2001, 38 (1-4) : 675 - 682
12345