Piezoelectric measurements with atomic force microscopy

被引：0
|
作者：
Christman, J.A. [1 ]
Maiwa, H. [2 ]
Kim, S.-H. [2 ]
Kingon, A.I. [2 ]
Nemanich, R.J. [1 ]
机构：
[1] Department of Physics, North Carolina State University, Raleigh, NC 27695, United States
[2] Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, United States
来源：
Materials Research Society Symposium - Proceedings | 1999年 / 541卷
关键词：
Atomic force microscopy - Conductive materials - Electric fields - Electric potential - Electric variables measurement - Electrodes - Hysteresis - Measurement errors - Piezoelectricity - Single crystals - Zirconia;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：617 / 622
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