Application of atomic force microscopy in adhesion force measurements

被引：13

作者：

Hassani, Sedigheh Sadegh ^{[1
,2
]}

Daraee, Maryam ^{[3
]}

Sobat, Zahra ^{[1
]}

机构：

[1] Res Inst Petr Ind RIPI, Catalysis Res Div, Tehran, Iran

[2] SPM Experts Work Grp, Iran Lab Network, Tehran, Iran

[3] Res Inst Petr Ind RIPI, Nanotechnol Res Ctr, Tehran, Iran

来源：

JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY | 2021年 / 35卷 / 03期

关键词：

Atomic force microscope; adhesion force; force curve; colloidal probe; nano Newton; SURFACE FREE-ENERGY; INTRAOCULAR-LENS; BACTERIAL ADHESION; PARTICLE ADHESION; BIOFILM FORMATION; OPTIC EDGE; AFM TIPS; NANOINDENTATION; CONTACT; CELLS;

D O I：

10.1080/01694243.2020.1798647

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

The adhesion force between the surfaces and various compounds is a fundamental feature that causes formation and modification of compounds and can be used to various applications. Adhesion force performs in several main ways that recognition and monitoring of this force would be very useful in the material study. Atomic force microscope (AFM) is a modern precisionist device which has been able to examine and closely monitor the adhesion force at the nanometer scale. The interaction forces between AFM tip and sample surface are considered to investigate the adhesion force. It can be applied to wide ranges of materials which are important in current modern industries such as pharmaceutical compounds, polymers, nanomaterials, and semiconductors.

引用

页码：221 / 241

页数：21

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