Predicting the reliability of Metal-Insulator-Metal capacitors (MIMC) in analog devices by modeling

被引：0
|
作者：
Greenwood, Bruce [1 ]
Prasad, Jagdish [1 ]
机构：
[1] AMI Semicond, Pocatello, ID 83201 USA
来源：
2007 INTERNATIONAL SEMICONDUCTOR DEVICE RESEARCH SYMPOSIUM, VOLS 1 AND 2 | 2007年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：130 / 131
页数：2
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