Characterization of light-emitting diodes based on InAsSbP/InAsSb structures grown by metal-organic vapor-phase epitaxy

被引:8
|
作者
Zotova, NV [1 ]
Kizhaev, SS [1 ]
Molchanov, SS [1 ]
Voronina, TI [1 ]
Lagunova, TS [1 ]
Pushnyi, BV [1 ]
Yakovlev, YP [1 ]
机构
[1] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
关键词
D O I
10.1134/1.1601666
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Light-emitting diodes for the wavelength range lambda = 3.3-4.5 mum were fabricated on the basis of InAsSbP/InAsSb heterostructures grown by metal-organic vapor-phase epitaxy. The use of vapor-phase epitaxy made it possible to appreciably increase the phosphorus content in barrier layers (up to 50%) in comparison with that attainable in the case of liquid-phase epitaxy; correspondingly, it was possible to improve confinement of charge carriers in the active region of the structures. Photoluminescent properties of InAsSb layers, electroluminescent properties of light-emitting diodes, and dependences of the emission power on current were studied. Two types of light-emitting diodes were fabricated: (i) with extraction of emission through the substrate (type A) and (ii) with extraction of emission through the epitaxial layer (type B). The light-emitting diodes operating in the pulse mode (with a relative pulse duration of 20) had an emission power of 1.2 mW at room temperature. (C) 2003 MAIK "Nauka / Interperiodica".
引用
收藏
页码:955 / 959
页数:5
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