A study on the nanometer grid method with the scanning tunneling microscope

被引：0

作者：

Huimin, X ^{[1
]}

Fulong, D

Haiqiang, Y

Ning, L

Dietz, P

Schmidt, A

机构：

[1] Tech Univ Clausthal, Inst Maschinenwesen, Clausthal Zellerfeld, Germany

[2] Chinese Acad Sci, Beijing Opening Lab Vacuum Phys, Beijing, Peoples R China

来源：

EXPERIMENTAL TECHNIQUES | 1998年 / 22卷 / 04期

关键词：

D O I：

10.1111/j.1747-1567.1998.tb02333.x

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

[No abstract available]

引用

页码：23 / 25

页数：3

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