A study on the nanometer grid method with the scanning tunneling microscope

被引：0
|
作者：
Huimin, X [1 ]
Fulong, D
Haiqiang, Y
Ning, L
Dietz, P
Schmidt, A
机构：
[1] Tech Univ Clausthal, Inst Maschinenwesen, Clausthal Zellerfeld, Germany
[2] Chinese Acad Sci, Beijing Opening Lab Vacuum Phys, Beijing, Peoples R China
来源：
EXPERIMENTAL TECHNIQUES | 1998年 / 22卷 / 04期
关键词：
D O I：
10.1111/j.1747-1567.1998.tb02333.x
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
[No abstract available]
引用
收藏
页码：23 / 25
页数：3
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