Room temperature operated single electron transistor made by a scanning tunnelling microscopy/atomic force microscopy nano-oxidation process

被引:4
|
作者
Matsumoto, K [1 ]
机构
[1] MITI, Electrotech Lab, Tsukuba, Ibaraki 305, Japan
关键词
D O I
10.1080/002072199133292
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Application of scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) to an electron device is introduced in this paper. Using a STM tip/AFM cantilever as a cathode, the surface of a metal is oxidized to form a few tens of nanometre wide oxidized metal line, which works as an energy barrier for an electron. A single electron transistor (SET) is fabricated using this fabrication process. As a STM/AFM, nano-oxidation process could fabricate the device size of the order of 10 nm, the fabricated SET operates even at a higher temperature than room temperature and shows the large Coulomb gap and staircase of 200 mV periods. An atomically Aat alpha-Al2O3 substrate is proposed for improving the uniformity and reproducibility of the oxidized line made by a STM/AFM nano-oxidation process.
引用
收藏
页码:641 / 662
页数:22
相关论文
共 50 条
  • [21] Room temperature single electron transitor by AFM nano-oxidation process - Coincidence in experimental and theoretical results
    Matsumoto, K
    Gotoh, Y
    Maeda, T
    Harris, JS
    STATE-OF-THE-ART PROGRAM ON COMPOUND SEMICONDUCTORS (SOTAPOCS XXXI), 1999, 99 (17): : 215 - 217
  • [22] OBSERVATION AND MANIPULATION OF POLYMERS BY SCANNING TUNNELLING AND ATOMIC FORCE MICROSCOPY
    DOVEK, MM
    ALBRECHT, TR
    KUAN, SWJ
    LANG, CA
    EMCH, R
    GRUTTER, P
    FRANK, CW
    PEASE, RFW
    QUATE, CF
    JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 229 - 236
  • [23] Scanning electron microscopy, scanning tunneling microscopy, and atomic force microscopy studies of selected videotapes
    Hammond, EC
    ATOMIC FORCE MICROSCOPY/SCANNING TUNNELING MICROSCOPY 2, 1997, : 215 - 226
  • [24] Application of scanning tunneling microscopy nanofabrication process to single electron transistor
    Matsumoto, K
    Ishii, M
    Segawa, K
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 1331 - 1335
  • [25] Enhanced nano-oxidation on a SC1-treated Si surface using atomic force microscopy
    Moon, W.-C., 1600, Japan Society of Applied Physics (41):
  • [26] SCANNING ELECTRON MICROSCOPY AND ATOMIC FORCE MICROSCOPY OF CHITOSAN COMPOSITE FILMS
    Cardenas, Galo
    Anaya, Paola
    Del Rio, Rodrigo
    Schrebler, Ricardo
    von Plessing, Carlos
    Schneider, Mark
    JOURNAL OF THE CHILEAN CHEMICAL SOCIETY, 2010, 55 (03): : 352 - 354
  • [27] DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELLING MICROSCOPY TO CHARGE-DENSITY WAVES
    MEYER, E
    ANSELMETTI, D
    WIESENDANGER, R
    GUNTHERODT, HJ
    LEVY, F
    BERGER, H
    EUROPHYSICS LETTERS, 1989, 9 (07): : 695 - 700
  • [28] Electrical conduction in layer silicates investigated by combined scanning tunnelling microscopy and atomic force microscopy
    Lindgreen, H
    CLAY MINERALS, 2000, 35 (04) : 643 - 652
  • [29] Nanoscopic characterization of a plastisol gelation and fusion process utilizing scanning electron microscopy and atomic force microscopy
    Jourdan, Jerome S.
    Owen, David P.
    JOURNAL OF VINYL & ADDITIVE TECHNOLOGY, 2008, 14 (03): : 99 - 104
  • [30] Nano-oxidation of silicon surfaces by noncontact atomic-force microscopy:: Size dependence on voltage and pulse duration
    Calleja, M
    García, R
    APPLIED PHYSICS LETTERS, 2000, 76 (23) : 3427 - 3429