Novel Fast-switching and High-data Retention Phase-change Memory Based on New Ga-Sb-Ge Material

被引:0
|
作者
Cheng, H. Y. [1 ]
Chien, W. C. [1 ]
BrightSky, M. [2 ]
Ho, Y. H. [1 ]
Zhu, Y. [2 ]
Ray, A. [2 ]
Bruce, R. [2 ]
Kim, W. [2 ]
Yeh, C. W. [1 ]
Lung, H. L. [1 ]
Lam, C. [2 ]
机构
[1] Macronix Int Co Ltd, Emerging Cent Lab, 16 Li Hsin Rd,Sci Pk, Hsinchu, Taiwan
[2] IBM TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Attempts to improve the retention so far must sacrifice switching speed. This work explores new phase change material based on pseudobinary GaSb-Ge system. The resulting new phase-change material has demonstrated fast switching speed of 80 ns, long endurance of 1G cycles and excellent data retention that survives 250 degrees C-300 hrs. The 10 years-220 degrees C data retention is the best ever reported. It is also the fastest material that can pass the solder bonding criteria for embedded automotive applications.
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页数:4
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