Dynamic hysteresis stability of ferroelectric Pb(Zr0.52Ti0.48)O3 thin films

被引：11
|
作者：
Liu, JM [1 ]
Xiao, Q
Liu, ZG
Chan, HLW
Ming, NB
机构：
[1] Nanjing Univ, Solid State Microstruct Lab, Nanjing 210093, Peoples R China
[2] Chinese Acad Sci, Int Ctr Mat Phys, Shenyang, Peoples R China
[3] Hong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong, Peoples R China
来源：
MATERIALS CHEMISTRY AND PHYSICS | 2003年 / 82卷 / 03期
关键词：
dynamic hysteresis; ferroelectric thin films; hysteresis scaling;
D O I：
10.1016/S0254-0584(03)00360-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Ferroelectric Pb(Zr0.52Ti0.48)O-3 (PZT) thin films sandwiched by YBa2Cu3O7 (YBCO) electrodes on (001) SrTiO3 wafers are prepared by pulsed laser deposition. The dynamic hysteresis response of the films to the periodic time-varying electrical field E(t) of different amplitude E-0 (0-45 kV cm(-1)) and frequency f (f = 10(-2) to 10(5) Hz) is measured. We study in detail the evolution and stability of the hysteresis pattern. A stability diagram for the dynamic hysteresis of PZT films is developed and an empirical scaling relationship covering the whole frequency range is proposed. Finally, we develop a Monte-Carlo (MC) algorithm based on the planar X-Y model to simulate the dynamic hysteresis in multi-domain spin systems and a qualitative consistency between the simulated dynamic behaviors and measured ones is established. (C) 2003 Published by Elsevier B.V.
引用
收藏
页码：733 / 741
页数：9
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