Use DSOs to catch elusive bugs in high-speed digital electronics

被引：0

作者：

Lauricella, F ^{[1
]}

机构：

[1] LeCroy Corp, Test & Measurement Div, Value Oscilloscope Grp, Chestnut Ridge, NY 10977 USA

来源：

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：121 / +

页数：4

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